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Optical Measurement of Surface Topography

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    Available in PDF - DJVU Format | Optical Measurement of Surface Topography.pdf | Language: ENGLISH
    Richard Leach(Editor)

    Book details


The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manu­facturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.

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Book details

  • PDF | 340 pages
  • Richard Leach(Editor)
  • Springer; 2011 edition (5 April 2011)
  • English
  • 3
  • Science & Nature

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Review Text

  • By Gino Giardini on 14 May 2011

    This edited collection is a very clear and systematic overview of techniques in a field of growing importance in engineering, technology and manufacturing. Professor Leach of the National Physical Laboratory (UK) has succeeded in bringing together some of the leading experts to cover topics such as Optical 3D Sensors, Chromatic Confocal Microscopy, Phase Shifting Interferometry, Digital Holographic Microscopy and Light Scattering Methods. The researcher and student will find the book to be state-of-the-art and facilitated by its ample use of graphic material including many useful colour images and extensive reference lists. Those who work in many fields - as diverse as fluidics, optics, tribology and aerodynamics - will want to have a copy on their shelf or in their library. Highly recommended.Prof. G. Hunt, St Mary's University College, London.

  • By David Tolfree on 14 May 2012

    Richard Leach who is an internationally recognised expert in surface topography has put together the contributions from many leading experts in the field to make this book an excellent comprehensive overview of all the optical measurement techniques. From my own experience I know that producing such a work requires not only thorough knowledge but also dedication and endurance. These techniques have become extremely important to designers and manufacturers of precison components and end-products at the micro-nanoscale where non-invasive measurements are essential. The book is well-structured and balanced to appeal to students, researchers and practitioners. The graphical material and extensive list of references are particularly useful. I recommend the book to all who wish to have a detailed knowledge of the fundamentals of optical measurement surface topography and the current techniques available.

  • By Chris Jones on 17 April 2012

    Measurement of surface topography on the micro- to nanoscale with optical measurement techniques is essential to support all the technological advantages we take for granted: consumer electronics; bioengineering; energy; transport; defence and more.This book contains a good balance of the relevant fundamentals and a thorough but practical description of the key optical techniques. It is ideally suited to teach a student or professional the power and limitations of the techniques.Professor Leach is an internationally-respected independent expert in surface topography measurement at the UK government-funded National Physical Laboratory. He has edited this book from the contributions of the experts and manufacturers for each optical measurement technique.As an expert in the field I would recommend this book.

  • By Adam on 14 June 2013

    Short version: a very good, comprehensive book that will get the Reader up to speed.Longer version:I recently started working on a research project in the area of surface metrology. Being an electronics engineer, my knowledge of the field was limited and consequently someone recommended that I read this book.As highlighted in other reviews, this book contains chapters on most state-of-the-art optical techniques that are currently applied to surface metrology. Each chapter was written by an expert (i.e. leading company CEO, leading researcher in the field or Mr "I invented most of this technique") and covers the principles of operation, applications and limitations of the respective technique. Each chapter also ends in an invaluable repository of links to the knowledge - the references.Overall, this book and the references that I had found in it helped me to get an in-depth knowledge for my specific application.On the down side, there are minor inconsistencies in writing styles between chapters but this is typical for edited books and does not affect the overall quality of this book - it's not a novel after all.


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